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Models in hardware testing : lecture notes of the forum in honor of Christian Landrault / edited by Hans-Joachim Wunderlich
- 作者： Wunderlich, Hans-Joachim.
- 其他作者：
- 其他題名：
- Springer eBooks
- Lecture notes of the forum in honor of Christian Landrault
- 出版： Dordrecht : Springer Science+Business Media B.V. 2010
- 叢書名： Frontiers in electronic testing ,v.43
- 主題： Electronic digital computers--Circuits--Testing. , Integrated circuits--Verification. , Integrated circuits--Computer simulation. , Circuits and Systems. , Engineering. , Performance and Reliability.
- ISBN： 9789048132829 (electronic bk.) 、 9789048132812 (paper)
- URL：
電子書
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讀者標籤：
- 系統號： 005161324 | 機讀編目格式
館藏資訊
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
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