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A designer's guide to built-in self-test / Charles E. Stroud
- 作者： Stroud, Charles E.
- 其他作者：
- 其他題名：
- Springer e-books
- 出版： Boston : Kluwer Academic Publishers c2002
- 叢書名： Frontiers in electronic testing
- 主題： Electronic apparatus and appliances--Testing. , Electronic apparatus and appliances--Design and construction. , Automatic test equipment.
- ISBN： 9780306475047 (electronic bk.) 、 9781402070501 (paper)
- URL：
電子書
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讀者標籤：
- 系統號： 005168457 | 機讀編目格式
館藏資訊
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
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