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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal
- 作者: Bushnell, Michael L.
- 其他作者:
- 其他題名:
- Springer e-books
- 出版: Boston : Kluwer Academic c2002
- 叢書名: Frontiers in electronic testing ;17
- 主題: Integrated circuits--Very large scale integration--Testing. , Digital integrated circuits--Testing. , Mixed signal circuits--Testing. , Semiconductor storage devices--Testing.
- ISBN: 9780306470400 (electronic bk.) 、 9780792379911 (paper)
- URL:
電子書
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讀者標籤:
- 系統號: 005168512 | 機讀編目格式