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Efficient test methodologies for high-speed serial links / by Dongwoo Hong, Kwang-Ting Cheng
- 作者： Hong, Dongwoo.
- 其他作者：
- 其他題名：
- Springer eBooks
- 出版： Dordrecht : Springer Science+Business Media B.V. 2010
- 叢書名： Lecture notes in electrical engineering ,v.51
- 主題： Very high speed integrated circuits--Testing. , Engineering. , Circuits and Systems. , Register-Transfer-Level Implementation.
- ISBN： 9789048134434 (electronic bk.) 、 9789048134427 (paper)
- URL：
電子書
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讀者標籤：
- 系統號： 005172841 | 機讀編目格式
館藏資訊
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
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